Copyright 2024 Molecular Vista
Don't Miss Out on the Future of Nanoscale Analysis!
Vista 300: The Most Advanced Nano-Chemical Metrology Instrument for R&D and Defect Analysis in Nanofabrication
#1 PiFM Nano-Scale Spectroscopy:
Why Molecular Vista Stands Out?
What Makes Us Different?
Speak to a Nano Spectroscopy Expert
Nanoscale IR Spectroscopy
Like you've never seen before: fast, accurate, and higher resolution than anyone else in the market.
With tunable IR lasers capable of sweeping a full PiF‑IR spectrum in just a few seconds ensuring higher-quality results and PiFM images acquired in minutes, the Vista systems deliver rapid, precise performance for demanding projects.
High - throughput
Fewer calibration steps mean less room for mistakes, ensuring consistently accurate results even for less experienced users.
Reduced User Error for Reliable Results
Suitable for delicate organic and biomolecular samples, ensuring sample integrity and longer probe lifespan.
Non-Destructive Nano-Scale Analysis
We are Leading Experts in Nanoscale Chemical Analysis, Offering the Highest Resolution Instruments for Faster, More Accurate Insights.
Unmatched Resolution: Get sub-10 nm chemical mapping and spectra, far better than other systems. Capable of capturing single-layer molecular details, ideal for ultra-thin films and monolayers.
Fast & Automated: Quick setup and automated analysis mean you spend less time on preparation and more on getting precise results.
High Signal-to-Noise Ratio (SNR): Provides better signal clarity than competing systems, ensuring that the data you collect is of the highest quality, even at the nanoscale.
Versatility: Supports multiple spectroscopy and imaging techniques, including PiFM, PiF-IR, and sSNOM (scattering-type Scanning Near-Field Optical Microscopy), making it a multi-functional tool for various nanoscale materials.
Non-Destructive: The system operates in a non-contact mode, ensuring that your delicate samples remain intact and uncontaminated.
Unmatched Precision and Performance
Experts in nanoscale chemical analysis.
Vista 300
Automated Defect Review for 12” Wafers — Faster Analysis, Consistent Results, Minimal Training
Time-Saving Automation: AutoPiFM generates complete datasets automatically, reducing manual effort.
Optimized Results: Computer vision aligns the excitation laser for precise, repeatable measurements.
Minimal Training: Automated alignment simplifies operation, making it easy to use with less training.
Maximized Efficiency: Compact design and controlled environment ensure stability and high throughput.
Vista 200
High-Precision, Non-Destructive Defect Analysis for 8” Wafers
Time-Saving Automation: Forward-moving stage and easy-access design streamline sample swaps for faster workflow.
Optimized Results: True non-contact PiFM preserves sample integrity while delivering high-precision chemical mapping.
Minimal Training: User-friendly setup with built-in stability features simplifies operation and reduces learning time.
Maximized Efficiency: Self-contained system with vibration isolation and temperature control ensures stable, reliable performance.
Vista 75
Hybrid Nano-Chemical Analysis — Compact, User-Friendly, and Tailored for Academia & Industry with sSNOM and Raman Capabilities
Faster Workflow: Pre-aligned optics and quick-change features make switching between techniques effortless.
Easy to Use: Accessible design with one-handed AFM head clamp for quick tip and sample exchanges.
High-Resolution Results: Sub-5 nm IR spatial resolution for ultra-precise chemical mapping.
Space-Saving Design: Compact footprint with built-in vibration isolation and temperature control.
The Most Flexible PiF Microscope — Environmental Control, Bottom Optics, and Temperature Staging for Specialized Academic Research
Vista One
Fast & Efficient: High-throughput measurements with dual Z-piezo scanning for quick, accurate results.
Easy to Use: Optical alignments stay intact even when changing samples, reducing setup time.
Unmatched Precision: Sub-10 nm PiF-IR spectroscopy and PiFM chemical mapping for detailed nanoscale analysis.
Versatile & Customizable: Supports multiple optical techniques, up to six lasers, and customizable environments for any experiment.
VISTA 300
Automated Alignment for 12” Wafers — faster turnaround, reliable results, less downtime and accuracy.
Advanced Automation for 12” Wafer Analysis
Vista 200 provides non-destructive, single-molecule chemical analysis for 8-inch wafers with industry-leading automation. Designed for semiconductors, it reduces training, speeds up sample swaps, and ensures reliable results with built-in stability.
VISTA 200
Automated Precision for 8” Wafer Analysis
User-friendly, and versatile — the only Vista series instrument supporting sSNOM and Raman for 4” Wafer Analysis
VISTA 75
Compact Precision for 4” Wafers with sSNOM & Raman Measurements
Vista One is the most flexible PiF microscope, designed for academic researchers and specialized experiments. As the only Vista instrument supporting an environmental control cover, bottom optics, and a heating/cooling stage, it delivers unmatched versatility.
VISTA One
Advanced Flexibility for Specialized Research
Ready to take your research to the next level?
All talks will be held at the Granville headquarters at Madison 36th, New York City.
Need a sample analyzed right now?
Get fast, reliable results without the need to invest in a machine. Let us handle the hard work so you can focus on what matters most - your research and discoveries.
Request a sample analysis here!
